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[DOWNLOAD] VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover)) by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, Khader S. Abdel-Hafez, Soumendu Bhattacharya, Abhijit Chatterjee, Xinghao Chen, Kwang-Ting (Tim) Cheng, William Eklow, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Rohit Kapur, Brion Keller, Kuen-Jong Lee, James C.-M. Li, Mike Peng Li, Xiaowei Li, T.M. Mak, Yinghua Min, Benoit Nadeau-Dostie, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Erik H. Volkerink, Duncan M. (Hank) Walker, Shianling Wu, Nur A. Touba ~ eBook PDF Kindle ePub Free

VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

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  • Title: VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
  • Author : Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, Khader S. Abdel-Hafez, Soumendu Bhattacharya, Abhijit Chatterjee, Xinghao Chen, Kwang-Ting (Tim) Cheng, William Eklow, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Rohit Kapur, Brion Keller, Kuen-Jong Lee, James C.-M. Li, Mike Peng Li, Xiaowei Li, T.M. Mak, Yinghua Min, Benoit Nadeau-Dostie, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Erik H. Volkerink, Duncan M. (Hank) Walker, Shianling Wu, Nur A. Touba
  • Release Date : *
  • Genre: Books,Engineering & Transportation,Engineering
  • Pages : * pages
  • Size : * KB

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